Qi Zhan, Xing Hu 0008, Xin Xia 0001, Shanping Li
Software Engineering Empirical Research Radar
REACT: IR-Level Patch Presence Test for Binary.
Paper detail page in SEER Radar.
ASE 2024
Testing / QA; Debugging / Fault Localization / Diagnosis / Repair
Abstract / Summary
Summary pending. This page currently provides paper metadata; an abstract or short summary will be added when available.
External Links
Local PDF is not available on SEER Radar yet. When a public source is recorded, this page will add a local reading link with source attribution.