Chao Ni 0001, Wei Wang 0087, Kaiwen Yang, Xin Xia 0001, Kui Liu 0001, David Lo 0001
Software Engineering Empirical Research Radar
The best of both worlds: integrating semantic features with expert features for defect prediction and localization.
Paper detail page in SEER Radar.
FSE 2022
Other
Abstract / Summary
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