Peiyu Liu 0003, Shouling Ji, Xuhong Zhang 0002, Qinming Dai, Kangjie Lu, Lirong Fu, Wenzhi Chen, Peng Cheng 0001, Wenhai Wang, Raheem Beyah
Software Engineering Empirical Research Radar
IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware.
Paper detail page in SEER Radar.
ASE 2021
Testing / QA
Abstract / Summary
Summary pending. This page currently provides paper metadata; an abstract or short summary will be added when available.
External Links
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