Software Engineering Empirical Research Radar

FLACK: Localizing Faults in Alloy Models.

Paper detail page in SEER Radar.

Authors

Guolong Zheng, ThanhVu Nguyen, Simón Gutiérrez Brida, Germán Regis, Marcelo F. Frias, Nazareno Aguirre, Hamid Bagheri

Venue / Year

ASE 2021

Topics

Other

Abstract / Summary

Summary pending. This page currently provides paper metadata; an abstract or short summary will be added when available.

External Links

DOI / Publisher

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