Software Engineering Empirical Research Radar

Faster Mutation Analysis with Fewer Processes and Smaller Overheads.

Paper detail page in SEER Radar.

Authors

Bo Wang 0050, Sirui Lu, Yingfei Xiong 0001, Feng Liu 0061

Venue / Year

ASE 2021

Topics

Testing / QA

Abstract / Summary

Summary pending. This page currently provides paper metadata; an abstract or short summary will be added when available.

External Links

DOI / Publisher

PDF

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